Wednesday, September 20, 2017

Measurements and Testing in RFID
10:00 Introduction to RFID Testing
10:30 Fundamentals of RFID Tag Properties
11:45 Coffee Break
12:00 Testing Tag Volumes and Readability
12:30 System Level Performance
13:30 Questions and Discussion
14:00 End of Workshop
Changes in agenda are possible.

Workshop speaker: Mr. Jesse Tuominen

Dr. Jesse Tuominen is the CTO and partner at Voyantic, a leading company in providing RFID test systems.
He is a Master of science in electrical engineering since 2002 and also received the degree of Doctor of Science in 2008 in the field of laser physics. For the last 10 years he has been designing RFID test systems for UHF and HF passive RFID technologies.

The workshop is free of charge, but enrollment is necessary. More information on the website: